Thermal Guardbanding
Stephen Crosher, CEO of Moortec, looks at the causes of thermal runaway in racks of servers and explains why accurate temperature measurement in AI and advanced-node chips is more critical, and what...
View ArticleAnalog Simulation At 7/5/3nm
Hany Elhak, group director of product management at Cadence, talks with Semiconductor Engineering about analog circuit simulation at advanced nodes, why process variation is an increasing problem, the...
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Wrestling With Variation In Advanced Node Designs
Variation is becoming a major headache at advanced nodes, and issues that used to be dealt with in the fab now must be dealt with on the design side, as well. What is fundamentally changing is that...
View ArticleCustom Designs, Custom Problems
Semiconductor Engineering sat down to discuss power optimization with Oliver King, CTO at Moortec; João Geada, chief technologist at Ansys; Dino Toffolon, senior vice president of engineering at...
View ArticlePerformance and Power Tradeoffs At 7/5nm
Semiconductor Engineering sat down to discuss power optimization with Oliver King, CTO at Moortec; João Geada, chief technologist at Ansys; Dino Toffolon, senior vice president of engineering at...
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Brute-Force Analysis Not Keeping Up With IC Complexity
Much of the current design and verification flow was built on brute force analysis, a simple and direct approach. But that approach rarely scales, and as designs become larger and the number of...
View ArticleNext-Gen Design Challenges
As more heterogeneous chips and different types of circuitry are designed into one system, that all needs to be simulated, verified and validated before tape-out. Aveek Sarkar, vice president of...
View ArticleDo We Have An IC Model Crisis?
Models are critical for IC design. Without them, it’s impossible to perform analysis, which in turn limits optimizations. Those optimizations are especially important as semiconductors become more...
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Designing Chips For Test Data
Collecting data to determine the health of a chip throughout its lifecycle is becoming necessary as chips are used in more critical applications, but being able to access that data isn’t always so...
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Reliability Concerns Shift Left Into Chip Design
Demand for lower defect rates and higher yields is increasing, in part because chips are now being used for safety- and mission-critical applications, and in part because it’s a way of offsetting...
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